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ATE Testing


SOC Chip test system

The IM800 series SOC chip test system is widely used in the engineering development, verification and mass production testing of SOC chips, and can meet the different needs of test equipment for a variety of test application scenarios of customers such as chip design companies, integrated circuit manufacturing enterprises, and professional chip packaging and testing factories to the greatest extent.

  • IM800D Main performance parameters
  • The machine supports 1920 digital channels (up to 800Mbps; 160M vector depth)
  • Support for time measurement units, support for memory test options.
  • The power channel supports up to 48A current.
  • The 4-quadrant power channel supports ±12V, ±1A
  • 8-channel AWG/DGT mixed signal, support 2-bit/16-bit high precision/high speed
  • The test is flexible and compatible with IM800A/IM800B/IM800C.

IM800 A

A high cost-performance SoC test system that balances both laboratory engineering development and mass production testing. (Max 256CH)

IM800 B

Mid-scale mass production integrated SoC test system with hard docking (Max 512 CH)

IM800 C

Highly compatible and flexibly expandable standard SoC test system (Max960CH)

IM800 D

High parallelism, high channel count, and high-performance SoC test system. (Max 1920CH)


DRAM Memory chip test system

The memory chip test system is divided into engineering verification system IM8000E and mass production test system IM8000, which are widely used in LPDDR series, DDR series and other IC verification, screening and mass production testing, and can complete the parameter test, functional test and RA analysis and repair of memory chips.

  • Main performance parameters
  • The system can be configured with up to 32 digital channel boards, up to 10240 channels (IO/DR)
  • The maximum output waveform speed is 400Mbps
  • There are a variety of storage spaces, e. g. AFM, CFM, DFM, UBM, DBM
  • Per Pin Parameter Count the measuring unit
  • The ALPG, X, Y, and Z address bits of flexible configuration support up to 24 bits, and the data bits are 36 bits*2
  • Strong and flexible RA analysis capabilities
  • 4-quadrant large current PMU, providing range -2.0~+7.0V / ±80mA

IM8000E

Memory testing machine for laboratory engineering (Max 1600 CH or more)

IM8000

A memory testing machine for mass production with high simultaneous testing and high channel count (Max 14000CH or more)


Flash memory chip test system

The Flash memory chip test system for non-volatile memory ICs includes the engineering verification system IM5000 ES and the mass production test system IM5000. These systems are widely used for IC verification, screening, and mass production testing of Nor Flash, Nand Flash, E2PROM, as well as emerging memory technologies such as RRAM, MRAM, and PCM. They support parameter testing, engineering validation, and RA (Reliability Analysis) diagnostics and repair for these non-volatile memory chips.

  • Main performance parameters
  • The system can be configured with up to 8 digital channel boards, supporting up to 2304 I/O channels with a maximum output waveform speed of 450 Mbps.
  • Supports wafer-level parallel testing of up to 1024 DUTs (2 channels per DUT).
  • Equipped with various types of memory storage, such as DBM, AFM, UBM, BBM, and DCM.
  • Per-pin parameter measurement unit.
  • Flexibly configurable ALPG with X, Y, Z address lines supporting up to 24 bits and 36-bit data width.
  • Configurable LPG supporting scan patterns for logic testing.
  • Supports Flash Counter and Fail Bit functions to significantly improve Flash testing efficiency.
  • Supports Pattern Trigger functionality, allowing flexible DC level settings and measurements within patterns.

IM5000 ES

Flash memory test system for laboratory engineering use. (Max 576 CH)

IM5000

Flash memory test system for mass production use. (Max 2304 CH)